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Hitachi High-Tech

Technologically advanced solutions supported with reliability-proven electron/probe microscopy systems to meet the challenges of materials science, biological research, and industrial manufacturing


Product Range:

  • Scanning Electron Microscopes (W, Cold FEG and Thermal FEG)
  • Transmission Electron Microscopes (W, LaB6, Cold FEG, Thermal FEG, Aberration Corrected)
  • Focussed Ion Beam Systems (FIB, FIB SEM and FIB FEGSEM)
  • Atomic Force Microscopy
  • Ion Beam Milling
  • Plasma Cleaners
  • Ion Sputter Coaters

 New Product


Hitachi High Technology